

第三代
半导体测试家族
Third generation semiconductor testing family
分类



QT-DRM101000 GaN Dynamic RDON
Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
Hard handover <1us |
Supports resistive/ inductive loads |
Support hard/
soft handover |
Multiple-pulse output |
Type | QT-DRM101000 |
Advantages |
QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution |
Main Features |
• Support FT or CP, laboratory, mass production testing • Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON • Output capacity 10A/1000V
|
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