中国·必发集团-www.7790.com|登录入口

第三代
半导体测试家族
Third generation semiconductor testing family
首页 7790必发集团官网 Test System Power Device Testing System
分类
 
QT-3105 TRR diode reverse recovery test

Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF



Independent programmable power supply

Support double DIE

Dual channel test

Waveform display

Type QT-3105TRR
Advantages Supports dual-core TRR parameter testing, equipped with VRR voltage probe
Main Features • Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns

Recommend推荐产品
Baidu
sogou